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Facilities: Characterizations

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Netzsch LFA 457 Laser Flash

The LFA 457 is one of the most recent aquisitions of CAML. The state-of-the-art laser flash system provides thermal diffusivity readings at temperatures ranging from from -100 to 1100 C. The system contains a three-sample carousel which greatly improves the speed at which samples may be characterized. When combined with density data, the information from this device yeilds thermal conductivity data.

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Netzsch DSC 405 "Pegasus"

The DSC 405 is a differential scanning calorimeter capible of characterizing a sample's specific heat from -160 to 1650 C, depending on the furnace used. This system allows CAML to accuratly determine specific heat and any phase changes a material goes through at high temperatures. Samples are held in an Argon enviroment to prevent reactions from occuring.

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R&S System

The R&S System is a customized system which CAML uses to determine the resistivity and thermopower of samples. These systems use a helium cryocooler capable of reaching temperatures below 10°K. Two samples are measured simultaneously in a vacuum of 10-3 torr and at temperatures ranging from 10°K to 300°K. The entire system is controlled by a computer running Labview.

The combination of automated computer control and dual sample mounts drastically reduces the amount of time necessary to measure the thermopower and resistivity of each sample. The modular mounting system reduces the amount of downtown experienced between data acquisition runs by allowing the sample mounts to be tested before being placed in the system. By combining data from this system with data obtained from the TCS (below) the dimensionless figure of merit (ZT) can be obtained for a sample. CAML currently operates two of these systems.

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Thermal Conductivity System

These systems are used by CAML to determine the thermal conductivity of samples. The systems use a helium cryocooler capable of reaching temperatures below 10°K. Two samples are measured simultaneously in a vacuum of 10-3 torr and at temperatures ranging from 10°K to 300°K, resulting in a detailed view of how the thermal conductivities of the samples vary with temperature. The entire system is automated and controlled by a computer running Labview.

The combination of automated computer control and dual sample mounts drastically increases the rate at which samples may be characterized. The modular mounting system reduces the amount of downtime between samples by allowing the mounted samples to be tested before being placed in the system. By combining data from this system with data obtained from the R&S System (above) the dimensionless figure of merit (ZT) can be obtained for a sample.

CAML currently operates three of these systems.

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High Temperature R&S System

The High Temperature R&S System is a newly created customized system which CAML will use to determine the resistivity and thermopower of samples beyond the capibilities of our cryocooled systems. This system uses a probe with bulk material mounting capibilities. Heat is suppied by a custumized furnace capible of achieving tempereatures in excess of 1500°K. This system will allow CAML to more completely characterize materials.

CAML currently operates one of these systems.

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Rikatu MiniFlex

The compact MiniFlex x-ray diffraction system is a relatively recent addition to CAML. It is used to determine the purity of sample crystals. It is equipped with an automatic sample changer which allows it to produce high resolution x-ray diffraction data for up to six samples without user intervention to change samples.

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Physical Property Measurement System

The Quantum Design PPMS is a powerful system for determining many useful characteristics of a sample. Thermopower, resistivity, thermal conductivity, and charge carrier density can all be determined using the PPMS. The system uses a 9 Tesla liquid-He cooled superconducting electromagnet.

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Olympus BX60M

The Olympus BX60 microscope is capable of both reflection and transmission imaging. Metallurgical imaging is possible using the microscope's built in polarized 100W light source and filters. The microscopes stage can accommodate large sample sizes.

This microscope is fitted with a Hitachi VK-C370 video camera.

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      This Page Last Updated : October 20, 2008 1:55 PM
CAML • 118 Kinard Laboratory • Clemson University • Clemson, South Carolina • 29634-0978
Phone: (864)656-7597 • Fax: (864)656-0805
Webmaster: Anil Jain.